FREQUENCY MEASUREMENT METHOD AND ITS DEVICE AND SEMICONDUCTOR TESTER,申请号JP19910161304-传众专利搜索

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发明名称	FREQUENCY MEASUREMENT METHOD AND ITS DEVICE AND SEMICONDUCTOR TESTER
摘要
申请公布号	JPH0510990(A)	申请公布日期	1993.01.19
申请号	JP19910161304	申请日期	1991.07.02
申请人	HITACHI LTD	发明人	HAYASHI YOSHIHIKO
分类号	G01R23/06;G01R23/10;G01R23/14;G01R23/15;H03K5/19	主分类号	G01R23/06
代理机构		代理人
主权项
地址

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