发明名称 Method of forming a crown shape capacitor
摘要 An etching process is used to etch the polysilicon layer. Then, Polymers are formed on the polysilicon layer after an ash step is performed. An organic layer is formed on the surface of the polysilicon layer, and on the polymers. An anisotropically etch is carried out to etch the organic layer, thereby forming organic side wall spacers on the side walls of the polysilicon layer. The etching is continuously performed to etch the polysilicon layer using the polymers and organic side wall spacers as masks. Next, an ash and a RCA clean procedure are performed to remove the residual polymers and the organic layer. A dielectric layer is then deposited on the surface of the polysilicon. A conductive layer is deposited over the dielectric layer.
申请公布号 US5851877(A) 申请公布日期 1998.12.22
申请号 US19980003301 申请日期 1998.01.06
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 HO, YU-CHUN;TSENG, HSIANG-WEI
分类号 H01L21/02;H01L21/3213;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/02
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