| 摘要 |
A socket for an electrical part has a socket body 14 and a contact pin 15. The contact pin 15 has a fixed portion 15e fixed to a through hole 14d of the socket body 14, a plate-like elastic piece 15b extending upward from the fixed portion 15e and a contact portion 15c to contact the electrical part, such as an IC chip under test. The elastic piece 15b is elastically deformable along a plate surface of the elastic piece, preferably by means of a vertically sliding pressing plate 16, so as to cause the contact portion to contact to and separate from a terminal of the electrical part. Each contact pin 15 preferably consists of a pair of elastic pieces 15b which cooperate to clamp onto a terminal of the electrical part. A biting portion 15f is formed between the fixed portion 15e and the contact portion 15c for biting a bitten portion 14h formed on an inner wall of the through hole 14d. Vertical movement of pin 15 is restricted when biting portion 15f, for example bulge 15f, bites the bitten portion 14h. Also when protuberance 15f bites the bitten portion 14h a preload is given to the elastic pieces 15b in a direction of closing the contact portion 15c of the elastic piece 15b such that elastic pieces 15b of contact pins are biased toward the closed position. |
