| 摘要 |
An at-real speed chip testing system and method using ATE(Automation Test Equipment) are provided to increase utilization of test equipment by dualistically carrying out a chip test according to a logic block of the chip. A system, equipped with ATE, tests a chip which has at least one logic block divided according to functions by comparing a test output signal fed back by an applied test input signal and a reference output signal stored in advance. A setting unit(205) sets a logic block with the maximum operation frequency higher than operation frequency of the ATE, as a first logic block. A result data receiving unit(210) receives communication result data processed by an additional module carrying out the function corresponding to the function of the first logic module and the first logic module. A test signal receiving unit(220) receives a test output signal fed back by the applied test input signal from the logic blocks except for the first logic block. A judging unit(230) judges whether communication result data corresponds to the function of the first logic block and whether the test output signal matches with the reference output signal. |
