发明名称 SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SAME
摘要 In the present invention, a MISFET has: a gate electrode formed on a semiconductor substrate with a gate insulation film interposed therebetween; and a source region and a drain region formed within the semiconductor substrate so as to sandwich the gate electrode. A first silicide layer is formed on the surfaces of the source region and drain region, and a second silicide layer is formed on the surface of the gate electrode. The first silicide layer and the second silicide layer are configured from a first metal and silicon, and include a second metal different from the first metal. The concentration of the second metal in the second silicide layer is lower than the concentration of the second metal in the first silicide layer.
申请公布号 WO2016147316(A1) 申请公布日期 2016.09.22
申请号 WO2015JP57897 申请日期 2015.03.17
申请人 RENESAS ELECTRONICS CORPORATION 发明人 YAMAGUCHI, Tadashi
分类号 H01L21/336;H01L21/8247;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/336
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