发明名称 Lithography system and method for device manufacture
摘要 A lithography system and method for cost-effective device manufacture that can employ a continuous lithography mode of operation is disclosed, wherein exposure fields are formed with single pulses of radiation. The system includes a pulsed radiation source (14), an illumination system (24), a mask (M), a projection lens (40) and a workpiece stage (50) that supports a workpiece (W) having an image-bearing surface (WS). A radiation source controller (16) and a workpiece stage position system (60), which includes a metrology device (62), are used to coordinate and control the exposure of the mask with radiation pulses so that adjacent radiation pulses form adjacent exposure fields (EF). Where pulse-to-pulse uniformity from the radiation source is lacking, a pulse stabilization system (18) may be optionally used to attain the desired pulse-to-pulse uniformity in exposure dose. The rapidity at which exposures can be made using a single radiation pulse allows for a very high throughput, which in turn allows for a small-image-field projection lens to be utilized in a cost-effective manner in the manufacture of devices such as semiconductor integrated circuits and the like. The system can also be used in the conventional "step-and-repeat" mode of operation, so that the system owner can decide the most cost-effective mode of operation for any given application.
申请公布号 US6753947(B2) 申请公布日期 2004.06.22
申请号 US20010854226 申请日期 2001.05.10
申请人 ULTRATECH STEPPER, INC. 发明人 MEISBURGER DAN;MARKLE DAVID A.
分类号 G03F7/22;G03F7/20;H01L21/027;(IPC1-7):G03B27/72;G03B27/42;G03B27/32;A61N5/00;G03C5/00 主分类号 G03F7/22
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