| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an optical time-domain reflectometry (OTDR) system capable of performing a precision OTDR test by suppressing the fading noise. <P>SOLUTION: The OTDR system 100a comprises an inspection light source 1a, that outputs the inspection light for OTDR test. The inspection light source comprises a semiconductor light-emitting element 10 and an optical waveguide 30, and is arranged at a position of being irradiated with a light from the semiconductor light-emitting element and is provided with a diffraction grating 35, whose reflection wavelength width is 1 nm or larger, which is arranged at a prescribed section. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
