| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for not only accurately measuring device characteristics due to process variation but also improving them. SOLUTION: A semiconductor device 8 is provided with a reference voltage circuit 9 made of multiple devices and capable of supplying reference voltage to terminals according to the supply voltage, and an analog-digital conversion circuit 10 for changing the output of the reference voltage circuit 9 to an equivalent digital value. A power supply IC is provided with a supply voltage level switching circuit 12 capable of controlling the supply voltage to be fed to the semiconductor device 8 according to the digital value output from the analog-digital conversion circuit 10, so that characteristic differences of the semiconductor device 8, which arise from process variations, can be fed back to the power supply IC11 to control the supply voltage level, resulting in achieving the compensation of process or characteristic variations in each semiconductor device. COPYRIGHT: (C)2005,JPO&NCIPI
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