发明名称 RESIST COMPOSITION AND PRODUCTION METHOD OF RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern can be produced with an excellent mask error factor and a fewer number of defects.SOLUTION: The resist composition comprises: (A1) a resin having a structural unit represented by formula (aa), and a structural unit represented by formula (a1-1) or a structural unit represented by formula (a1-2); (A2) a resin that is insoluble or poorly soluble in an aqueous alkali solution but changes into soluble with an aqueous alkali solution by an action of an acid and that has no structural unit represented by formula (aa) but has a structural unit containing a hydroxyadamantane group; and (B) an acid generator.SELECTED DRAWING: None
申请公布号 JP2016128921(A) 申请公布日期 2016.07.14
申请号 JP20160020450 申请日期 2016.02.05
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;HIRAOKA TAKASHI;FUJITA SHINGO
分类号 G03F7/039;C08F220/18;C08F220/24;C08F220/28;G03F7/004;G03F7/20 主分类号 G03F7/039
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