发明名称 PLASMA-AETZVERFAHREN FUER CHROM- SCHICHTEN
摘要 <p>In the prod. of semi-conductors in which substrates are coated with Cr or Mo or W and covered with a mask, which is then etched to form the required structures, etching is carried out by using a plasma of a reaction gas which consists of a mixt. of gaseous O2 and CF4, pref. 90% O2 and 10% CF4. Plasma etching is performed at a pressure inside the vessel of 0.1-10 torr. The mask is composed of Al metal. Method is more economical and does not present health hazards as the reaction gas is free of Cl gas. Safety measures are not necessary and the reactor can be made of less costly material. Used for the prod. of semi-conductors.</p>
申请公布号 DE2738839(A1) 申请公布日期 1979.03.15
申请号 DE19772738839 申请日期 1977.08.29
申请人 SIEMENS AG 发明人 HASLER,BARBARA
分类号 C23F4/00;H01L21/28;H01L21/3213;(IPC1-7):01K1/00 主分类号 C23F4/00
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