SEMICONDUCTOR DEVICE AND DATA PROCESSING SYSTEM

摘要

PROBLEM TO BE SOLVED: To reduce a chip occupying area by a circuit configuration for giving a voltage from a test external terminal to a memory cell at the time of screening by giving an output voltage from an internal power source voltage generator to the cell in a normal operating time state. SOLUTION: An external terminal VEXT directly led from a power source supply line VCM of a memory cell out of a chip is provided. And, an internal power source voltage generator VCMG has a function of an output terminal OUT to a high impedance state. Thus, an insertion of a MOS switch in series between the power source supply line of the cell, the internal power source voltage generator and a testing external terminal is not required. No voltage drop occurs at the switch. And, a chip occupying area of the circuit for giving an operating power to the cell can be reduced.