发明名称 Laser processing method of semiconductor device
摘要 It is intended to provide a technique of separately forming thin-film transistors disposed in a peripheral circuit area and those disposed in a pixel area in accordance with characteristics required therefor in a manufacturing process of semiconductor devices to constitute a liquid crystal display device. In an annealing step by laser light illumination, laser light is selectively applied to a semiconductor thin-film by partially masking it. For example, to illuminate the peripheral circuit area and the pixel area with laser light under different conditions in manufacture of an active matrix liquid crystal display device, laser light is applied at necessary illumination energy densities by using a mask. In this manner, a crystalline silicon film having a necessary degree of crystallinity in a selective manner can be obtained.
申请公布号 US6008101(A) 申请公布日期 1999.12.28
申请号 US19970968480 申请日期 1997.11.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TANAKA, KOICHIRO;YAMAGUCHI, NAOAKI
分类号 G03F1/14;G03F7/20;H01L21/20;H01L21/77;H01L21/84;(IPC1-7):H01L29/792;H01L21/306 主分类号 G03F1/14
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