发明名称 Solid-state imaging device and manufacturing method thereof and semiconductor device manufacturing method
摘要 A solid-state imaging device is able to prevent a sensitivity from being lowered and to suppress a smear caused as a pixel size is reduced and to provide an excellent image quality even though it is miniaturized and a manufacturing method thereof is proposed.Also, a method of manufacturing a semiconductor device is able to form a conductive layer having an excellent adhesion with an underlayer and whose surface has an excellent flatness in the process for forming a metal interconnection and the process for burying a contact-hole. A solid-state imaging device (20) includes a light-shielding film (6) of a two layer structure comprising a first film (11) formed of a film deposited by a sputtering or vapor deposition and a second film (12) formed of a tungsten film deposited by a chemical vapor deposition.
申请公布号 US6781210(B2) 申请公布日期 2004.08.24
申请号 US20010917681 申请日期 2001.07.31
申请人 SONY CORPORATION 发明人 SUGIMOTO DAI;MATSUDA TAKESHI
分类号 H01L27/14;H01L21/00;H01L21/4763;H01L31/02;(IPC1-7):H01L31/02 主分类号 H01L27/14
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