发明名称 CHARGE CARRIER EXTRACTING TRANSISTOR
摘要 An extracting transistor (10) - an FET - includes a conducting channel extending via a p-type InSb quantum well (22) between p-type InA1Sb layers (20, 24) of wider band-gap. One of the InA1Sb layers (24) incorporates an ultra-thin n-type delta -doping layer (28) of Si, which provides a dominant source of charge carriers for the quantum well (22). It bears n<+> source and drain electrodes (30a, 30b) and an insulated gate (30c). The other InA1Sb layer (20) adjoins a barrier layer (19) of still wider band-gap upon a substrate layer (14) and substrate (16) with electrode (18). Biasing one or both of the source and drain electrodes (30a, 30b) positive relative to the substrate electrode (18) produces minority carrier extraction in the quantum well (22) reducing its intrinsic contribution to conductivity, taking it into an extrinsic saturated regime and reducing leakage current.
申请公布号 WO0188995(A1) 申请公布日期 2001.11.22
申请号 WO2001GB01919 申请日期 2001.05.02
申请人 QINETIC LIMITED;PHILLIPS, TIMOTHY, JONATHAN 发明人 PHILLIPS, TIMOTHY, JONATHAN
分类号 H01L21/338;H01L29/10;H01L29/778;H01L29/78;H01L29/812;(IPC1-7):H01L29/778;H01L29/15 主分类号 H01L21/338
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