发明名称 Illumination system for a microlithography projection exposure apparatus
摘要 An illumination system for a microlithography projection exposure apparatus is designed for illuminating an illumination field with an illumination radiation with a predeterminable degree of coherence sigma, it being possible to adjust the degree of coherence within a degree of coherence range extending into the range of very small degrees of coherence of significantly less than sigma=0.2. The illumination system may have a first optical system for generating a predeterminable light distribution in an entrance plane of a light mixing device, and also a light mixing device for homogenizing the impinging radiation. The first optical system and the light mixing device can in each case be changed over between a plurality of configurations corresponding to different degree of coherence ranges. The degree of coherence ranges overlap and are dimensioned such that the resulting total degree of coherence range is larger than the individual degree of coherence ranges.
申请公布号 US2006126049(A1) 申请公布日期 2006.06.15
申请号 US20050271844 申请日期 2005.11.14
申请人 CARL ZEISS SMT AG 发明人 DEGUENTHER MARKUS;WANGLER JOHANNES;BROTSACK MARKUS;MIZKEWITSCH ELLA
分类号 G03B27/72;G02B27/09;G03F;G03F7/20 主分类号 G03B27/72
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