发明名称 SETTING METHOD OF CORRECTION VALUE, CORRECTION VALUE SETTING SYSTEM, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To obtain many kinds of correction values from limited kinds of densities of a test pattern. <P>SOLUTION: The following processes (A)-(E) are carried out. (A) The test pattern with a plurality of regions different in density is printed on the basis of a plurality of instruction tone values. (B) A measured value of the density is acquired by measuring the density for each of the plurality of regions. (C) On the basis of the measured values, the correction value is set for each of the plurality of instruction tone values. (D) For setting the correction value of the other instruction tone value different from the plurality of instruction tone values, a ratio between an instruction tone value before corrected and an instruction tone value after corrected is acquired for the instruction tone value nearest to the other instruction tone value among the plurality of instruction tone values. (E) The correction value of the other instruction tone value is set to make the same ratio as the ratio between the instruction tone value before corrected and the instruction tone value after corrected for the nearest instruction tone value. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008044276(A) 申请公布日期 2008.02.28
申请号 JP20060223440 申请日期 2006.08.18
申请人 SEIKO EPSON CORP 发明人 YOSHIDA MASAHIKO;NUNOKAWA HIROICHI;ISHIMOTO BUNJI;NAKANO TATSUYA;KAKEHASHI YOICHI;MIYAMOTO TORU
分类号 B41J2/01;B41J2/205;B41J2/52;B41J29/46;H04N1/46;H04N1/60 主分类号 B41J2/01
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