发明名称 Low-capacitance input/output and electrostatic discharge circuit for protecting an integrated circuit from electrostatic discharge
摘要 A transistor formed on a semiconductor substrate of a first conductivity type in a well formed in the substrate and doped with the first conductivity type to an impurity level higher than that of the substrate. A drain doped to a second conductivity type opposite to said first conductivity type is disposed in the well. A pair of opposed source regions doped to the second conductivity type are disposed in the well and are electrically coupled together. They are separated from opposing outer edges of the drain region by channels. A pair of gates are electrically coupled together and disposed above and insulated from the channels. A region of the well disposed below the drain is doped so as to reduce capacitive coupling between the drain and the well.
申请公布号 US7482218(B1) 申请公布日期 2009.01.27
申请号 US20070677441 申请日期 2007.02.21
申请人 ACTEL CORPORATION 发明人 MCCOLLUM JOHN;DHAOUI FETHI
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项
地址