发明名称 |
Devices and method for testing power-on reset voltage |
摘要 |
A system having a power on reset circuit including a voltage divide), a multiplexer coupled to two outputs of the voltage divider, a first comparator coupled to the multiplexer and a reference, a logic gate coupled to the first comparator, a second comparator coupled to one of the two outputs of the voltage divider, and an emulation gate coupled to the second comparator. |
申请公布号 |
US9362904(B2) |
申请公布日期 |
2016.06.07 |
申请号 |
US201414193649 |
申请日期 |
2014.02.28 |
申请人 |
Freescale Semiconductor, Inc. |
发明人 |
Dao Chris C.;Pietri Stefano;Ren Juxiang |
分类号 |
G01R31/3187;H03K17/22;G01R19/165;G06F1/24 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
1. A system having a power on reset circuit, wherein the power on reset circuit comprises:
a voltage divider coupled to a supply voltage terminal that has a first output and a second output; a multiplexer having a first input coupled to the first output, a second input coupled to the second output, and an output; and a first comparator having a first input coupled to the output of the multiplexer, a second input coupled to a reference, and an output; a logic gate having a first input coupled to the output of the first comparator, a second input, and an output, wherein the output of the logic gate is a power on reset terminal that provides a power on reset signal; a second comparator having a first input coupled to the first output of the voltage divider, a second input coupled to the reference, and an output coupled to the second input of the logic gate; and an emulation gate having an input coupled to the output of the second comparator and an output, wherein the output of the emulation gate is a power on reset test terminal that provides a power on reset test signal. |
地址 |
Austin TX US |