发明名称 |
COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition having excellent CD uniformity.SOLUTION: The present invention provides a compound represented by formula (I) [Ris a C1-6 alkyl group which may comprise a halogen atom, H or a halogen atom; Ais a single bond or-A-CO-O-; Ais a C1-6 alkanediyl group; Wis a substituted/unsubstituted 4-18 divalent alicyclic hydrocarbon group, preferably an adamantanediyl group; Ris H, a C1-12 hydrocarbon group which may comprise a cyano group; a methylene group included in the hydrocarbon group is optionally substituted by an oxygen atom or a carbonyl group; Ris a C1-12 hydrocarbon group which may comprise a cyano group].SELECTED DRAWING: None |
申请公布号 |
JP2016138219(A) |
申请公布日期 |
2016.08.04 |
申请号 |
JP20150015243 |
申请日期 |
2015.01.29 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
SAKAMOTO HIROSHI;ICHIKAWA KOJI |
分类号 |
C08F22/10;G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
C08F22/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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