发明名称 OPTICAL ENDPOINT DETECTION SYSTEM
摘要 Methods and apparatus for determining an endpoint of a process chamber cleaning process are provided. In some embodiments, a processing system having an endpoint detection system may include a process chamber having internal surfaces requiring periodic cleaning due to processes performed in the process chamber; and an endpoint detection system that includes a light detector positioned to detect light reflected off of a first internal surface of the process chamber; and a controller coupled to the light detector and configured to determine an endpoint of a cleaning process based upon the detected reflected light.
申请公布号 US2016263634(A1) 申请公布日期 2016.09.15
申请号 US201615162160 申请日期 2016.05.23
申请人 APPLIED MATERIALS, INC. 发明人 RAMACHANDRAN BALASUBRAMANIAN;ISHII MASATO;HUNTER AARON MUIR
分类号 B08B9/46;C23C16/52;G01N21/94;C23C16/44;B08B3/08;B08B3/10 主分类号 B08B9/46
代理机构 代理人
主权项 1. A method of monitoring a process being performed in a process chamber, comprising: performing a cleaning process in a process chamber to remove material deposited on one or more internal surfaces of the process chamber resultant from processes performed within the process chamber; shining a light on a first internal surface being cleaned; detecting the light reflected off of the first internal surface; and terminating the cleaning process based upon the detected light.
地址 Santa Clara CA US