发明名称 |
CIRCUITRY ON AN INTEGRATED CIRCUIT FOR PERFORMING OR FACILITATING OSCILLOSCOPE, JITTER, AND/OR BIT-ERROR-RATE TESTER OPERATIONS |
摘要 |
An integrated circuit ("IC") may include circuitry for use in testing a serial data signal. The IC may include circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. The IC may also include circuitry for receiving the serial data signal and performing a bit error rate ("BER") analysis in such a signal. The IC may provide output signals indicative of results of its operations. The IC can operate in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc. |
申请公布号 |
EP2603805(A4) |
申请公布日期 |
2016.10.19 |
申请号 |
EP20110816812 |
申请日期 |
2011.08.02 |
申请人 |
ALTERA CORPORATION |
发明人 |
LI, PENG;SHIMANOUCHI, MASASHI;SHUMARAYEV, SERGEY;DING, WEIQI;NARAYAN, SRIRAM;CHOW, DANIEL TUN LAI;PAN, MINGDE |
分类号 |
G01R31/303;G01R31/317;H04L7/033 |
主分类号 |
G01R31/303 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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