发明名称 FORMATION OF IMPROVED SOI SUBSTRATES USING BULK SEMICONDUCTOR WAFERS
摘要 <p>The present invention relates to semiconductor-on-insulator (SOI) substrates having device regions (2, 4, 6), each comprises a base semiconductor substrate layer (12) and a semiconductor device layer (16) and a buried insulator layer (14) between. The semiconductor device layer (16) supported by vertical insulating pillars (22), each having a ledge extending between the base semiconductor substrate layer (12) and the semiconductor device layer (16). The SOI substrates of the present invention can be readily formed from a precursor substrate structure with a "floating" semiconductor device layer that is spaced apart from the base semiconductor substrate layer by an air gap (15) and is supported by the vertical insulating pillars (22). The air gap (15) is preferably formed by selective removal of a sacrificial layer (13) located between the base semiconductor substrate layer (12) and the semiconductor device layer (16).</p>
申请公布号 WO2007140288(A3) 申请公布日期 2008.04.24
申请号 WO2007US69720 申请日期 2007.05.25
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;CHIDAMBARRAO, DURESETI;HENSON, WILLIAM, K.;NG, HUNG, Y.;RIM, KERN;WANN, CLEMENT, H. 发明人 CHIDAMBARRAO, DURESETI;HENSON, WILLIAM, K.;NG, HUNG, Y.;RIM, KERN;WANN, CLEMENT, H.
分类号 H01L21/76 主分类号 H01L21/76
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