发明名称 |
Circuit and method for selecting test self-refresh period of semiconductor memory device |
摘要 |
The present invention provides a self-refresh period adaptable for testing cells that are weak against hot temperature stress. An apparatus for controlling a self-refresh operation in a semiconductor memory device includes a first period selector for generating one of a period-fixed pulse signal having a constant period and a period-variable pulse signal having a variable period based on a temperature of the semiconductor memory device in a test mode; and a self-refresh block for performing the self-refresh operation in response to an output of the first period selector.
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申请公布号 |
US7548478(B2) |
申请公布日期 |
2009.06.16 |
申请号 |
US20070976356 |
申请日期 |
2007.10.24 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
LEE KYONG-HA |
分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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