发明名称 |
DISK-SHAPED GLASS SUBSTRATE, MAGNETIC-DISK GLASS SUBSTRATE, METHOD FOR MANUFACTURING MAGNETIC-DISK GLASS SUBSTRATE, AND MAGNETIC DISK |
摘要 |
A disk-shaped glass substrate for a magnetic-disk glass substrate includes an outer circumference having a roundness of 1.3 μm or less. A first reference circle is obtained with a least squares method from a first outline corresponding to a shape of a lap around the outer circumference. A second reference circle is obtained with a least squares method from a second outline obtained by performing low-pass filtering using a period in which the number of peaks per lap is 150 as a cut-off value on the first outline. A ratio of the second peak count value defined by the number of peaks of the second outline that project outward in a radial direction from the second reference circle to the first peak count value defined by the number of peaks of the first outline that project outward in a radial direction from the first reference circle is 0.2 or less. |
申请公布号 |
US2016163344(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201414894859 |
申请日期 |
2014.06.27 |
申请人 |
KASHIMA Ryuichi |
发明人 |
KASHIMA Ryuichi |
分类号 |
G11B5/82;G11B5/84;G11B5/73 |
主分类号 |
G11B5/82 |
代理机构 |
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代理人 |
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主权项 |
1. A disk-shaped glass substrate comprising:
a pair of main surfaces, the disk-shaped glass substrate being to be made into a magnetic-disk glass substrate, an outer circumference of the disk-shaped glass substrate having a roundness of 1.3 μm or less, a first reference circle being obtained with a least squares method from a first outline corresponding to a shape of a lap around the outer circumference of the disk-shaped glass substrate, and the number of peaks of the first outline that project outward in a radial direction from the first reference circle being defined as a first peak count value, a second reference circle being obtained with a least squares method from a second outline obtained by performing low-pass filtering using a period in which the number of peaks per lap is 150 as a cut-off value on the first outline, and the number of peaks of the second outline that project outward in a radial direction from the second reference circle being defined as a second peak count value, and a ratio of the second peak count value to the first peak count value being 0.2 or less. |
地址 |
Tokyo JP |