| 发明名称 |
Automated Test Equipment for Testing a Device Under Test and Method for Testing a Device Under Test |
| 摘要 |
An automated test equipment for testing a device under test includes a control unit and a plurality of tester subunits. The control unit is configured to put the tester subunits in a state of lower activity in dependence on a current demand on the test resources. |
| 申请公布号 |
US2016169962(A1) |
申请公布日期 |
2016.06.16 |
| 申请号 |
US201615051479 |
申请日期 |
2016.02.23 |
| 申请人 |
Horst Jonas;Nuessle Heinz;Laquai Bernd |
发明人 |
Horst Jonas;Nuessle Heinz;Laquai Bernd |
| 分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An automated test equipment for testing a device under test, comprising:
a control unit; and a plurality of tester subunits; wherein the control unit is configured to put the tester subunits in a state of lower activity in dependence un a current demand on the tester subunits. |
| 地址 |
Fichtenberg DE |
