METHOD OF ANALYZING SURFACE OF SAMPLE USING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE THEREFOR

摘要

Provided are methods for analyzing a surface of a sample using a scanning probe microscope including a cell-attached probe and scanning probe microscopes therefor.

主权项

1. A method of analyzing a surface of a sample using a scanning probe microscope, the method comprising:
providing a probe including a cantilever and a cell attached thereto; moving the probe relative to a sample surface using a scanner to allow interaction between the sample surface and the probe; measuring a deflection distance of the probe using a deflection sensor; and determining an interaction force between the probe and the sample surface based on the deflection distance.