发明名称 PROJECTION LENS ARRANGEMENT
摘要 A charged particle multi-beamlet system for exposing a target using a plurality of beamlets. The system comprises a first plate having a plurality of holes formed in it, with a plurality of electrostatic projection lens systems formed at the location of each hole so that each electron beamlet passes through a corresponding projection lens system. The holes have sufficiently uniform placement and dimensions to enable focusing of the beamlets onto the surface of the target using a common control voltage. Preferably the electrostatic projection lens systems are controlled by a common electrical signal to focus the electron beamlets on the surface without correction of the focus or path of individual electron beamlets.
申请公布号 EP2260499(B1) 申请公布日期 2016.11.30
申请号 EP20090715482 申请日期 2009.02.26
申请人 MAPPER LITHOGRAPHY IP B.V. 发明人 WIELAND, MARCO JAN-JACO;KAMPHERBEEK, BERT JAN;VAN VEEN, ALEXANDER HENDRIK VINCENT;KRUIT, PIETER;STEENBRINK, STIJN WILLEM HERMAN KAREL
分类号 H01J37/12;H01J37/30;H01J37/317 主分类号 H01J37/12
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