发明名称 Method of manufacturing a capacitor for a DRAM cell.
摘要 <p>A capacitor suitable for use with a DRAM memory cell is composed of multiple layers of polycrystalline silicon. The storage node is formed from a polycrystalline silicon layer sandwiched between two polysilicon ground plate layers. First the bottom polycrystalline silicon plate layer (26)is fabricated, followed by an isolation step and fabrication of the storage node polycrystalline silicon layer(30,50). Following another isolation step, the polycrystalline silicon top plate layer(62)is then formed and connected to the bottom plate layer. The storage electrode employs a buffer polysilicon layer (30) and contacts the active region via an etched hole using sidespacer insulation(48). Sidespacers (60) are also used to isolate the outer edges of the storage electrode. <IMAGE></p>
申请公布号 EP0430404(B1) 申请公布日期 1994.12.14
申请号 EP19900309525 申请日期 1990.08.30
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 CHAN, TSIU CHIU;BRYANT, FRANK RANDOLPH
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/04
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