发明名称 HIGH VOLTAGE MOSFET STRUCTURE
摘要 PROBLEM TO BE SOLVED: To reduce an on-state resistance by a method wherein a dopant is vertically distributed in a thickness direction of a layer in an injection region and the injection region is approximately equalized. SOLUTION: A blocking layer provides each P section 30 and N section 32 alternatively. Each vertical type section 30 and 32 has dopant concentration from approximately 1E<12> /cm<2> to 2E<12> /cm<2> . A main condition regarding to a maximum dopant concentration of the vertical type section 30, 32 is that the concentration of each vertical section is sufficiently low, and a depletion region can spread over a horizontal thickness B of the vertical section 30, 32 to horizontal direction before a horizontal electric field reaches a critical electric field. The thickness of the blocking layer in vertical direction is made thinner than that of vertical direction of an ordinary device. Furthermore, because current flows in the N-type section 32 in vertical direction, the blocking layer has lower resistance than that of ordinary device.
申请公布号 JPH11233759(A) 申请公布日期 1999.08.27
申请号 JP19980318826 申请日期 1998.11.10
申请人 HARRIS CORP 发明人 NEILSON JOHN
分类号 H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/06
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