发明名称 ULTRAVIOLET MICROSCOPE AND OBSERVATION METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an ultraviolet microscope capable of for reducing a sample damage caused on the occasion of ultraviolet rays observation and to provide an observation method using the same. SOLUTION: The ultraviolet microscope is provided with ultraviolet rays observation means (21-26, 41 and 43) by which a sample (11) is observed based on ultraviolet rays, gas supply means (51-57) by which an inert gas is supplied between the ultraviolet rays observation means and the sample, and a timing control means (13) which controls the inert gas supply timing by the gas supply means. In addition, the timing control means makes the gas supply means preliminarily supply the inert gas before observing the sample ultraviolet rays, and also fully supply the inert gas at least during the time of observing the sample with ultraviolet rays.
申请公布号 JP2002328306(A) 申请公布日期 2002.11.15
申请号 JP20010132239 申请日期 2001.04.27
申请人 NIKON CORP;TOSHIBA CORP 发明人 TSURUMUNE TOKUJI;MIZUNO JIRO;ITO SHINICHI;TAKAHASHI RIICHIRO;EMA TATSUHIKO
分类号 G02B21/00;G02B21/16;G02B21/26;G02B21/36;(IPC1-7):G02B21/00 主分类号 G02B21/00
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