发明名称 Reference pattern zeta potential measurement apparatus and method therefor
摘要 The zeta potential of a fluid sample is determined by adjusting the horizontal scan rate of a reference pattern superimposed over an image of the fluid particle movement displayed on a monitor. The scan rate is adjusted by a potentiometer and is compensated in accordance with a function related to the temperature of the sample and the voltage gradient of the electrophoresis cell. The sample within the electrophoresis cell is irradiated with cold light through a plane substantially perpendicular to the field of gravity and the irradiated chamber may be magnified in a plane substantially parallel to the field of gravity before being displayed. The electrophoresis cell is a transparent elongated chamber having a section with flat surfaces and transparent windows bonded to the flat surfaces and means bonded to one of the windows to form a confined optical path for viewing a selected area of the section. Each end of the elongated chamber includes passages for the introduction and egress of fluid as well as an electrode for application of a voltage gradient to cause particle movement.
申请公布号 US3909380(A) 申请公布日期 1975.09.30
申请号 US19740489918 申请日期 1974.07.19
申请人 KOMLINE-SANDERSON ENGINEERING CORPORATION 发明人 DAY, JAMES T.;CROSBY, ROBERT J.;WILLS, WALTER R.
分类号 G01N27/26;G01N27/447;(IPC1-7):B01K5/00 主分类号 G01N27/26
代理机构 代理人
主权项
地址