发明名称 |
Reference pattern zeta potential measurement apparatus and method therefor |
摘要 |
The zeta potential of a fluid sample is determined by adjusting the horizontal scan rate of a reference pattern superimposed over an image of the fluid particle movement displayed on a monitor. The scan rate is adjusted by a potentiometer and is compensated in accordance with a function related to the temperature of the sample and the voltage gradient of the electrophoresis cell. The sample within the electrophoresis cell is irradiated with cold light through a plane substantially perpendicular to the field of gravity and the irradiated chamber may be magnified in a plane substantially parallel to the field of gravity before being displayed. The electrophoresis cell is a transparent elongated chamber having a section with flat surfaces and transparent windows bonded to the flat surfaces and means bonded to one of the windows to form a confined optical path for viewing a selected area of the section. Each end of the elongated chamber includes passages for the introduction and egress of fluid as well as an electrode for application of a voltage gradient to cause particle movement.
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申请公布号 |
US3909380(A) |
申请公布日期 |
1975.09.30 |
申请号 |
US19740489918 |
申请日期 |
1974.07.19 |
申请人 |
KOMLINE-SANDERSON ENGINEERING CORPORATION |
发明人 |
DAY, JAMES T.;CROSBY, ROBERT J.;WILLS, WALTER R. |
分类号 |
G01N27/26;G01N27/447;(IPC1-7):B01K5/00 |
主分类号 |
G01N27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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