发明名称 |
CARRIER MODULE FOR SEMICONDUCTIOR TEST HANDLER |
摘要 |
A carrier module for a semiconductor test handler is provided to increase the number of semiconductors installed in one carrier module by minimizing the pitch between the semiconductors and to cope with various work environment conditions actively by controlling the number of semiconductors. A carrier module(100) for a semiconductor test handler is composed of a carrier body(110) attached to a test tray, wherein the upper and the lower parts of the carrier body are opened; at least two placing members(120) installed at the lower part of the carrier body in at least two rows, in order to load plural semiconductors(8) on the upside; and a latch(140) fixing plural semiconductors positioned on the placing members at the same time. Both ends of the latch are connected to the carrier body to move elastically and fix the semiconductors positioned on the placing members by elastic force.
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申请公布号 |
KR100822281(B1) |
申请公布日期 |
2008.04.16 |
申请号 |
KR20060118887 |
申请日期 |
2006.11.29 |
申请人 |
MIRAE CORPORATION |
发明人 |
AN, JUNG UG;BEOM, HEE RAK;YUN, DAE GON |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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