发明名称 |
PRE-SILICIDE SPACER REMOVAL |
摘要 |
A pre-silicide spacer removal is provided to protect a silicide layer by firstly removing the spacer before forming the silicide layer, and to protect a source/drain region and an isolation region by covering a mask when the spacer is removed. A gate conductor(116) is formed on a substrate(102). A spacer(122) is formed at both sides of the gate conductor. A source/drain region(110) is formed by implanting impurities into an exposed region of the substrate which is not protected by the spacer and the gate conductor. A mask(130) is deposited on the gate conductor, the spacer and the source/drain region. A portion of the spacer is exposed by recessing the mask so that the source/drain region may be protected by the mask. The spacer and the mask are removed. A silicide region is formed on the gate conductor and the source/drain region.
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申请公布号 |
KR20080033130(A) |
申请公布日期 |
2008.04.16 |
申请号 |
KR20070103243 |
申请日期 |
2007.10.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION;INFINEON TECHNOLOGIES AG |
发明人 |
KIM, JUN JUNG;DYER THOMAS W .;FANG SUNFEI;LIU YAOCHENG;ZHU HUILONG;YAN JIANG |
分类号 |
H01L21/336;H01L21/24 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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