| 摘要 |
An inspection system for visually inspecting one or more inspection locations within a structure, the inspection system including one or more imaging devices mounted within the structure to view the inspection locations, at least one light source to illuminate the inspection locations during inspection, and a wiring harness extending from the imaging device to at least one external port of the structure and configured to supply electrical power to the imaging device from a power supply external to the structure when connected to the port during inspection, and to carry image data representing images of the inspection locations from the imaging device to an external device for viewing by a user of the inspection system. |
