发明名称 High precision pattern forming method of manufacturing a semiconductor device
摘要 According to the present invention, there is provided a method of manufacturing a semiconductor device, where a soluble thin film which is soluble in a dissolving liquid is used. According to the method of the present invention, when a soluble thin film is formed between a film to be processed which should be patterned and a mask pattern, it becomes possible to remove the mask pattern by lifting-off. On the other hand, when the thin film is used for a dummy layer for forming an air wiring structure, the dummy layer can be removed without performing ashing using oxygen plasma.
申请公布号 US6846750(B1) 申请公布日期 2005.01.25
申请号 US20000604724 申请日期 2000.06.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OHIWA TOKUHISA;SETA SHOJI;HAYASAKA NOBUO;OKUMURA KATSUYA;KOJIMA AKIHIRO;OHUCHI JUNKO;AZUMA TSUKASA;ICHINOSE HIDEO;MIZUSHIMA ICHIRO
分类号 H01L21/302;H01L21/033;H01L21/30;H01L21/306;H01L21/3065;H01L21/311;H01L21/316;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/302
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