发明名称 Dual work function gate in CMOS device
摘要 A transistor has a first silicon layer comprising a source region and a drain region separated by a channel region. A gate oxide is formed over the first silicon layer. A second silicon layer is formed over the gate oxide and comprises a dual work function gate. The dual work function gate may include p+ and n+ gate regions such that the transistor has different threshold voltages.
申请公布号 US2006124975(A1) 申请公布日期 2006.06.15
申请号 US20040008435 申请日期 2004.12.09
申请人 HONEYWELL INTERNATIONAL INC. 发明人 FATHIMULLA MOHAMMED A.
分类号 H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/76
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