发明名称 CURRENT-VOLTAGE AMPLIFIER CIRCUIT AND SEMICONDUCTOR TESTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a current-voltage amplifier circuit capable of measuring current being a range or more and weak current by amplifying voltage to the range of the semiconductor testing apparatus or more and applying the voltage. SOLUTION: The current-voltage amplifier circuit is provided with: a current amplifier circuit 201 which is provided with an amplifier Q1 in which an input signal is input to its noninverted input terminal, a resistor R1 connected between the noninverted input terminal of the amplifier Q1 and the output terminal, and a resistor R2 connected between the output terminal of the amplifier Q1 and the noninverted input terminal, wherein an output signal line for transmitting a signal to a DUT is connected between the resistor R2 and the noninverted input terminal of the amplifier Q1; and a voltage ratio setting circuit 301 which is provided with an amplifier Q2 in which a noninverted input terminal is connected to an output signal line, and the noninverted input terminal and an output terminal are shirt-circuited, a resistor R3 whose both ends are connected to the noninverted input terminal of the amplifier Q1 and ground, and a resistor R4 whose both ends are connected to the noninverted input terminal of the amplifier Q1 and the output terminal of the amplifier Q2. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008167118(A) 申请公布日期 2008.07.17
申请号 JP20060353886 申请日期 2006.12.28
申请人 YOKOGAWA ELECTRIC CORP 发明人 ABE HIROAKI
分类号 H03F3/34;G01R31/28 主分类号 H03F3/34
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