发明名称 Methods and apparatus for automatic fault detection
摘要 Techniques and mechanisms are provided to monitor signals including critical signals at the endpoints, or leaves, of one or more signal trees in an integrated circuit device. Sensors or layers of sensors may be configured in fault detection circuitry to monitor signals and compare them to static or dynamically varying values. The fault detection circuits may include OR-gate daisy chains that output a fault detection signal to control circuitry if any signal at a particular leaf deviates from an expected signal. Fault detection circuits may also be configured to identify instances where two or more or N or more signals deviate from an expected signal. Mechanisms may also be provided to assure the reliability of fault detection circuitry itself.
申请公布号 US9360522(B2) 申请公布日期 2016.06.07
申请号 US201614990735 申请日期 2016.01.07
申请人 Altera Corporation 发明人 Pedersen Bruce B.
分类号 G01R27/28;G01R31/3177;G06F11/07;G11C29/56;G01R31/3187;G01R31/327;G01R31/317 主分类号 G01R27/28
代理机构 代理人
主权项 1. An integrated circuit device comprising: control logic configured to send a signal onto a signal tree included on the integrated circuit device, the signal tree comprising branches and leaves, wherein the branches and leaves include columns and rows of circuit lines configured to carry signals from a signal source to signal endpoints, wherein each leaf of the signal tree comprises a signal endpoint; and fault detection circuitry on the integrated circuit device configured to monitor, using sensors, a plurality of signal values at each of the leaves on the signal tree such that the fault detection circuitry can detect faults at any point along the branches of the signal tree, the fault detection circuitry being further configured to generate a fault detect signal, wherein the control logic is further configured to mask the fault detect signal upon determining that the fault detect signal should be masked.
地址 San Jose CA US