发明名称 Method to increase cracking threshold for low-k materials
摘要 A method of increasing the cracking threshold of a low-k material layer comprising the following steps. A substrate having a low-k material layer formed thereover is provided. The low-k material layer having a cracking threshold. The low-k material layer is plasma treated to increase the low-k material layer cracking threshold. The plasma treatment including a gas that is CO2, He, NH3 or combinations thereof.
申请公布号 US6867126(B1) 申请公布日期 2005.03.15
申请号 US20020289718 申请日期 2002.11.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LI LIH-PING;LU YUNG-CHEN;KO CHUNG-CHI
分类号 H01L21/26;H01L21/3105;H01L21/316;H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/26
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