发明名称 SUBSTRATE TREATING APPARATUS AND METHOD FOR MEASURING AMOUNT OF BACKLASH
摘要 PROBLEM TO BE SOLVED: To provide a substrate treating apparatus by which the moving position of a movable part which moves for the treatment or the transport of substrates can be controlled with high degrees of accuracy, and to provide a method for measuring the amount of backlash. SOLUTION: A driving mechanism is provided with a stepping motor 1, a driving pulley 2 mounted on the axis of the motor, an idler pulley 3 and a timing belt 4 which is looped over between the driving pulley 2 and the idler pulley 3. A sector 6 for confirming position is mounted on the timing belt 4. A returning limit sensor 6 is disposed in the returning direction of the timing belt 4, and an advancing limit sensor 8 is disposed in the advancing direction. Prior to the operation of the driving mechanism, the stepping motor 1 is provided with the same number of driving pulses in both the forward and reverse directions. The difference between the moving amount in the advancing direction B of the timing belt 4 and that in the returning direction A is detected based on to the number of driving pulses of the stepping motor 1.
申请公布号 JPH11154697(A) 申请公布日期 1999.06.08
申请号 JP19970319982 申请日期 1997.11.20
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 SEGAWA SATOSHI
分类号 B65G49/07;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65G49/07
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