发明名称 |
SUPER BGA SEMICONDUCTOR PACKAGE |
摘要 |
PURPOSE: A super BGA(ball grid array) package is provided to facilitate circuit action performance test and reliability test by increasing the circuit board size larger than heat sink size and supplying a test pattern part. CONSTITUTION: The super BGA package array(10) comprises a PCB(printed circuit board)(S) equipped with a heat sink(HS), a circuit pattern on the PCB(S) and a ball(B) at the bottom of the PCB(S). An extension part(20) is formed by protruding the PCB(S) more than the heat sink(HS). A test pattern part(30) formed on the extension part(20) is connected with the circuit pattern on the PCB(S). A terminal(31) is equipped on the test pattern part(30) that is connected with a circuit testing probe.
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申请公布号 |
KR100258350(B1) |
申请公布日期 |
2000.06.01 |
申请号 |
KR19970018623 |
申请日期 |
1997.05.13 |
申请人 |
AMKOR TECHNOLOGY KOREA, INC. |
发明人 |
SHIN, WON-SUN |
分类号 |
H01L23/12;(IPC1-7):H01L23/12 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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