发明名称 SUPER BGA SEMICONDUCTOR PACKAGE
摘要 PURPOSE: A super BGA(ball grid array) package is provided to facilitate circuit action performance test and reliability test by increasing the circuit board size larger than heat sink size and supplying a test pattern part. CONSTITUTION: The super BGA package array(10) comprises a PCB(printed circuit board)(S) equipped with a heat sink(HS), a circuit pattern on the PCB(S) and a ball(B) at the bottom of the PCB(S). An extension part(20) is formed by protruding the PCB(S) more than the heat sink(HS). A test pattern part(30) formed on the extension part(20) is connected with the circuit pattern on the PCB(S). A terminal(31) is equipped on the test pattern part(30) that is connected with a circuit testing probe.
申请公布号 KR100258350(B1) 申请公布日期 2000.06.01
申请号 KR19970018623 申请日期 1997.05.13
申请人 AMKOR TECHNOLOGY KOREA, INC. 发明人 SHIN, WON-SUN
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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