发明名称 POLISHING METHOD, POLISHING DEVICE, AND SEMICONDUCTOR DEVICE PRODUCING METHOD
摘要 A wafer (30) is polished by relatively moving a polishing body and the wafer (30) while applying a load between the polishing body and the wafer (30), with a polishing agent interposed between the polishing body and the wafer (30). A first step polishes the wafer (30) by using a hard polishing pad (42) as the polishing body while pressing the wafer (30) against the polishing pad (42) by air pressure. A second step following the first step uses a soft polishing pad as the polishing body to polish the wafer (30). This reduces erosion, dishing, etc., and provides a polished surface having few microscratches, further improving the flatness.
申请公布号 WO02056356(A1) 申请公布日期 2002.07.18
申请号 WO2002JP00009 申请日期 2002.01.07
申请人 NIKON CORPORATION;MATHUKAWA, EIJI 发明人 MATHUKAWA, EIJI
分类号 B24B37/013;B24B37/04;B24B37/20;B24B37/24;B24B37/26;B24B57/02;H01L21/304;H01L21/321;(IPC1-7):H01L21/304;B24B37/00 主分类号 B24B37/013
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