| 摘要 |
Provided is a circuit inspection probe device with which it is easy to visually confirm, from the front of the device, that a stroke contraction state of an appropriate ratio is reached. A circuit inspection probe device (10) for performing mainly an electrical test has a probe (2) that is planted in a probe retention hole (8) and is replaceable, and the circuit inspection probe device ensures conduction between a contact point (1) of the probe (2) and a microelectrode section (21) which is disposed on a substrate (20) under test and which can be contacted by the contact point (1), wherein: the probe (2) is constituted by a telescopic structure (6) in which a mandrel section (5) against which a pressing force is applied in the direction of being pushed out by the elastic force of a spring is inserted and fit into a sheath section (4) accommodating the spring; the mandrel section (5) is composed of a base section (51) able to advance or withdraw in accordance with extension or contraction of the telescopic structure (6) along an axis (7) over one straight line relative to the sheath section (4), and a head section (52) extending from the base section (51); and a cut-out section (50) is engraved into an outer peripheral surface of the base section (51). |
