| 摘要 |
The present invention relates to a probe card and, more specifically, to a needle resistance measurement system of a no-initial-stress (NIS) vertical probe card, configured to improve a problem of an existing horizontal probe card, develop a probe card by developing a manufacturing process to reduce manufacturing costs, and measure contact resistance of a probe needle. According to the present invention, the system comprises: a constant current supply unit; a voltage measurement unit; a moving unit; a communication unit; a control unit; a storage unit; and a display unit. |
