发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE, AND DISCHARGE RATE MEASURING UNIT
摘要 The present invention relates to a substrate treatment apparatus. According to one embodiment of the present invention, the substrate treatment apparatus comprises: a support unit supporting a substrate; a nozzle unit having one or more heads injecting treatment solution to the substrate supported by the support unit; and a discharge amount measurement unit measuring a discharged amount of the treatment solution discharged from the nozzle. The discharge amount measurement unit can comprise: a stage providing a space where the discharge amount of the treatment solution is measured; a roller member supplying a test film to and recovering the test film from the stage, wherein the test film is to measure the discharge amount; and a suction member sucking the treatment solution discharged on the test film.
申请公布号 KR20160083420(A) 申请公布日期 2016.07.12
申请号 KR20140194768 申请日期 2014.12.31
申请人 SEMES CO., LTD. 发明人 CHO, CHEON SU;PARK, JUN WOO
分类号 B41J2/045;B41J29/393 主分类号 B41J2/045
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