发明名称 |
APPARATUS AND METHOD FOR TREATING SUBSTRATE, AND DISCHARGE RATE MEASURING UNIT |
摘要 |
The present invention relates to a substrate treatment apparatus. According to one embodiment of the present invention, the substrate treatment apparatus comprises: a support unit supporting a substrate; a nozzle unit having one or more heads injecting treatment solution to the substrate supported by the support unit; and a discharge amount measurement unit measuring a discharged amount of the treatment solution discharged from the nozzle. The discharge amount measurement unit can comprise: a stage providing a space where the discharge amount of the treatment solution is measured; a roller member supplying a test film to and recovering the test film from the stage, wherein the test film is to measure the discharge amount; and a suction member sucking the treatment solution discharged on the test film. |
申请公布号 |
KR20160083420(A) |
申请公布日期 |
2016.07.12 |
申请号 |
KR20140194768 |
申请日期 |
2014.12.31 |
申请人 |
SEMES CO., LTD. |
发明人 |
CHO, CHEON SU;PARK, JUN WOO |
分类号 |
B41J2/045;B41J29/393 |
主分类号 |
B41J2/045 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|