发明名称 THIN FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method for a semiconductor device that has a low off-state current, and preferably has a high on-state current and high mobility, the method being performed in simplified processes.SOLUTION: In manufacturing a channel-etch type thin film transistor, at least a semiconductor layer is formed on a gate insulation layer; a conductive film is formed on the semiconductor layer; an etching mask is formed on the conductive film; a substrate is carried into a reaction chamber; the conductive film is processed to form a source electrode and a drain electrode layer; a semiconductor etching gas is introduced in the reaction chamber; etching is performed by using the semiconductor etching gas in the reaction chamber; the substrate is carried out from the reaction chamber; and subsequently the etching mask is removed. That is, processes from processing of the conductive film to the etching that is performed by using the semiconductor etching gas are continuously performed in the same chamber and the etching performed by using the semiconductor etching gas is performed before removing the etching mask.SELECTED DRAWING: Figure 1
申请公布号 JP2016197734(A) 申请公布日期 2016.11.24
申请号 JP20160126258 申请日期 2016.06.27
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SASAGAWA SHINYA;FUJIKI HIROSHI
分类号 H01L21/336;G02F1/1368;H01L21/3065;H01L29/786 主分类号 H01L21/336
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