发明名称 Method of forming contact plug on silicide structure
摘要 A method of manufacturing a semiconductor device is provided. A semiconductor element is formed on a substrate. The semiconductor element has at least one nickel silicide contact region, an etch stop layer formed over said element, and an insulating layer formed over said etch stop layer. A portion of the etch stop layer immediately over a selected contact region is removed using a process that does not substantially react with the contact region, to form a contact opening. The contact opening is then filled with a conductive material to form a contact.
申请公布号 US6884736(B2) 申请公布日期 2005.04.26
申请号 US20020265937 申请日期 2002.10.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO, LTD. 发明人 WU CHII-MING;WANG MEI-YUN;CHANG CHIH-WEI;HSIEH CHIN-HWA;SHUE SHAU-LIN;FU CHU-YUN;HSU JU-WANG;TSAI MING-HUAN;CHIU YUAN-HUNG
分类号 H01L21/311;H01L21/60;H01L21/768;(IPC1-7):H01L21/302 主分类号 H01L21/311
代理机构 代理人
主权项
地址