DEVICE AND PROCEDURE TO MEASURE WITHOUT CONTACT THE SURFACE-CONTOUR OF AN OBJECT

摘要

A plurality of strip patterns are successively projected onto the object (O) to be measured, for example in time-division multiplex operation, and the phases of the strip patterns distorted by the object at the pixels are determined in an image processing computer downstream of the camera (K). …For the purpose of increasing the measurement range in the direction of the camera axis (z), at least two beat frequencies of very different effective wavelength are evaluated, which are generated by, e.g., projecting the strip patterns of three projectors (P1, P2, P3) inclined at different angles ( alpha 1, alpha 2) to one another. ……