Method for controlling a test for an ATM exchange

摘要

A method for controlling a test for an ATM exchange in which a number of test cell generating devices to be activated is limited in association with a load applied to a central processing device so that the test is preformed without occurrence of congestion. The test is performed by using test cells transmitted from a plurality of test cell generating devices provided in the exchange. A load applied to the central processing device is measured, and a number of test cell generating devices to be used is calculated so that the measured load is maintained below a previously set limit value. The test for the exchange is performed by concurrently using the calculated number of test cell generating devices.