发明名称 MEMORY TEST METHOD AND MEMORY TESTER
摘要 <p>A memory test method by which a first random number is generated, the address of a memory to be tested is specified by the first random number, a second random number is generated, the second random number is written to the specified address as data, a random number taking the same value as the first random number is regenerated, the address of the memory to be tested is specified by the regenerated random number, the written data is read out, a random number taking the same value as the second random number is regenerated, and the regenerated random number is compared with the read out data is provided.</p>
申请公布号 WO2009028051(A1) 申请公布日期 2009.03.05
申请号 WO2007JP66679 申请日期 2007.08.28
申请人 FUJITSU LIMITED;YANASE, TAKESHI;KAMEYAMA, SHUICHI;UESAKA, KOUJI 发明人 YANASE, TAKESHI;KAMEYAMA, SHUICHI;UESAKA, KOUJI
分类号 G11C29/10;G01R31/28 主分类号 G11C29/10
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